35 results on '"Barrett N."'
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2. Generalized slab universal instability and its appearance in pair plasma
3. Interface chemistry of pristine TiN/La: Hf 0.5 Zr 0.5 O 2 capacitors
4. Physical chemistry of the TiN/Hf0.5Zr0.5O2 interface
5. Evidence for a surface anomaly during the cubic-tetragonal phase transition in BaTiO3(001)
6. Erratum: “Global 3D two-fluid simulations of the tokamak edge region: Turbulence, transport, profile evolution, and spontaneous E × B rotation” [Phys. Plasmas 24, 055903 (2017)]
7. Gyrokinetic theory of slab universal modes and the non-existence of the gradient drift coupling (GDC) instability
8. Global 3D two-fluid simulations of the tokamak edge region: Turbulence, transport, profile evolution, and spontaneous E × B rotation
9. Two-fluid biasing simulations of the large plasma device
10. Bistability of patterns of synchrony in Kuramoto oscillators with inertia
11. Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions
12. Publisher's Note: “Three-dimensional two-fluid Braginskii simulations of the large plasma device” [Phys. Plasmas 22, 092121 (2015)]
13. Three-dimensional two-fluid Braginskii simulations of the large plasma device
14. Surface atomic and chemical structure of relaxor Sr0.63Ba0.37Nb2O6(001)
15. Gyrokinetic simulations of collisionless reconnection in turbulent non-uniform plasmas
16. Electronic structure of Al- and Ga-doped ZnO films studied by hard X-ray photoelectron spectroscopy
17. Full field electron spectromicroscopy applied to ferroelectric materials
18. Screening of ferroelectric domains on BaTiO3(001) surface by ultraviolet photo-induced charge and dissociative water adsorption
19. Dark field photoelectron emission microscopy of micron scale few layer graphene
20. The quench rule, Dimits shift, and eigenmode localization by small-scale zonal flows
21. Photoemission induced bias in two-dimensional silicon pn junctions
22. Gyrokinetic simulations of the tearing instability
23. Extrinsic screening of ferroelectric domains in Pb(Zr0.48Ti0.52)O3
24. Multiple scattering x-ray photoelectron diffraction study of the SrTiO3(100) surface
25. X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy investigation of Al-related dipole at the HfO2/Si interface
26. The scaling of forced collisionless reconnection
27. Band offsets of HfO2∕GeON∕Ge stacks measured by ultraviolet and soft x-ray photoelectron spectroscopies
28. High-resolution photoelectron spectroscopy of Ge-based HfO2 gate stacks
29. Band offsets of nitrided ultrathin hafnium silicate films
30. Synchrotron radiation x-ray photoelectron spectroscopy of Si nanocrystals grown onto Al2O3∕Si surfaces
31. Publisher's Note: “Thermal stability of the HfO2∕SiO2 interface for sub-0.1 μm complementary metal-oxide-semiconductor gate oxide stacks: A valence band and quantitative core-level study by soft x-ray photoelectron spectroscopy” [J. Appl. Phys. 96, 6362 (2004)]
32. Thermal stability of the HfO2∕SiO2 interface for sub-0.1μm complementary metal-oxide-semiconductor gate oxide stacks: A valence band and quantitative core-level study by soft x-ray photoelectron spectroscopy
33. HfO2/SiO2 interface chemistry studied by synchrotron radiation x-ray photoelectron spectroscopy
34. Annealing of zinc-implanted GaAs
35. Multiple scattering x-ray photoelectron diffraction study of the SrTiO3(100) surface
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