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Series of GaN nanowires (NW) with controlled diameters (160–500 nm) and heights (420–1100 nm) were homoepitaxially grown on three different templates: GaN/Si(111), GaN/AlN/Si(111), and GaN/sapphire(0001). Transmission electron microscopy reveals a strong influence of the NW diameter on dislocation filtering effect, whereas photoluminescence measurements further relate this effect to the GaN NWs near-bandgap emission efficiency. Although the templates' quality has some effects on the GaN NWs optical and structural properties, the NW diameter reduction drives the dislocation filtering effect to the point where a poor GaN template quality becomes negligible. Thus, by a proper optimization of the homoepitaxial GaN NWs growth, the propagation of dislocations into the NWs can be greatly prevented, leading to an exceptional crystal quality and a total dominance of the near-bandgap emission over sub-bandgap, defect-related lines, such as basal stacking faults and so called unknown exciton (UX) emission. In additi...

A uniformly n-type doped GaN:Si nanowire (NW), with a diameter of d = 90 nm and a length of 1.2 μm, is processed into a metal-semiconductor field effect transistor (MESFET) with a semi-cylindrical top Ti/Au Schottky gate. The FET is in a normally-ON mode, with the threshold at −0.7 V and transconductance of gm ∼ 2 μS (the transconductance normalized with NW diameter gm/d > 22 mS/mm). It enters the saturation mode at VDS ∼ 4.5 V, with the maximum measured drain current IDS = 5.0 μA and the current density exceeding JDS > 78 kA/cm2.

This work gives a detailed insight into how the formation of (Al,Ga)N transient layers (TLs) at the interfaces of AlN/GaN Bragg reflectors modifies their structural and optical properties. While abrupt AlN/GaN interfaces are typically characterized with a network of microcracks, those with TLs are characterized with a network of nanocracks. Transmission electron microscopy reveals a strong correlation between strain and the TLs thickness, identifying thus the strain as the driving force for TLs formation. The AlN/GaN intermixing preserves the targeted stopband position (∼410 nm), whereas the peak reflectivity and the stopband width are both reduced, but still significantly high: >90% and >30 nm, respectively. To model their optical properties, a reduced refractive index contrast approximation is used, a novel method which yields an excellent agreement with the experiment.

We report on molecular beam epitaxy growth and characterization of ten-period lattice-matched InAlN/GaN distributed Bragg reflectors (DBRs), with peak reflectivity centered around 400 nm. Thanks to the well tuned ternary alloy composition, crack-free surfaces have been obtained, as confirmed by both optical and transmission electron microscopy (TEM). Their good periodicity and well-defined interfaces have been confirmed by both x-ray diffraction and TEM measurements. Peak reflectivity values as high as 60% with stop bands of 30 nm have been demonstrated. Optical measurements revealed that discrepancy between the obtained (60%) and the theoretically expected (∼75%) reflectivity is a consequence of significant residual absorption (∼35%). TEM measurements revealed the coexistence of zinc-blende and wurtzite phases, as well as planar defects, mainly in GaN. These defects are suggested as the potential source of the undesired absorption and/or scattering effects that lowered the DBRs’ peak reflectivity.