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We have recorded the x-ray diffraction (XRD) patterns of nanometer-size W metal clusters prepared at different average cluster sizes. Nanometer-size W metal clusters were produced through a collision induced clustering mechanism of W metal atoms generated by decomposing W(CO)6 vapors. The XRD patterns clearly showed that structure changed from amorphous→face- centered-cubic (fcc)→body-centered-cubic (bcc) with increasing average cluster size. This implies that W metal clusters do not simply approach the bulk bcc structure but pass through an intermediate fcc structure before they reach the bulk structure, as predicted by Tomanek, Mukherjee, and Bennemann [Phys. Rev. B 28, 665 (1983)].

In order to improve the material properties of the protective layer for alternating current plasma display panels, a small amount of ZnO was added to the MgO protective layer. The electrical properties and the surface characteristics of the Mg1−xZnxO films, deposited by a radio frequency magnetron sputtering method, were investigated. As the concentration of ZnO increases, the crystallinity of Mg1−xZnxO thin films improves and the grain size becomes larger. The firing and the sustaining voltages of panels with the Mg1−xZnxO protective layers, when the concentration of ZnO was 0.5at.%, was reduced by 20V, compared with the conventional panels with the MgO protective layers. It was also found that the panels with Mg1−xZnxO protective layers show the higher discharge intensity as the ZnO content increases at the same applied voltages, compared with panels with the conventional MgO protective layers.