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The precise determination of refractive index (n) of material and thickness (t) of thin-films are desirable for many applications in the field of optics and optoelectronics. In the proposed work, we have utilized a computational genetic algorithm (GA) to find the refractive index and the thickness from the experimentally measured reflectivity spectra of thin-film. The algorithm was implemented using the Lab VIEW as a programming tool. The obtained results show that the prepared algorithm successfully calculates the spectral dependence of refractive index and thickness of thin-films by fitting an experimentally measured reflectivity spectra with the calculated ones.