20 results on '"Pomeranz, Irith"'
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2. A delay fault model for at-speed fault simulation and test generation
3. N-detection under transparent-scan
4. On test generation for transition faults with minimized peak power dissipation
5. Transient-fault recovery for chip multiprocessors
6. On undetectable faults in partial scan circuits
7. Conflict driven techniques for improving deterministic test pattern generation
8. On output response compression in the presence of unknown output values
9. Random limited-scan to improve random pattern testing of scan circuits
10. An approach to test compaction for scan circuits that enhances at-speed testing
11. On diagnosis of pattern-dependent delay faults
12. Fault simulation under the multiple observation time approach using backward implications
13. On static compaction of test sequences for synchronous sequential circuits
14. On synthesis-for-testability of combinational logic circuits
15. Design-for-testability for path delay faults in large combinatorial circuits using test-points
16. On improving fault diagnosis for synchronous sequential circuits
17. INCREDYBLE-TG
18. Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits
19. NEST
20. On achieving a complete fault coverage for sequential machines using the transition fault model
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