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Your search keyword '"SCANNING electron microscopes"' showing total 3 results

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Start Over You searched for: Descriptor "SCANNING electron microscopes" Remove constraint Descriptor: "SCANNING electron microscopes" Topic x-ray diffraction Remove constraint Topic: x-ray diffraction Publication Year Range This year Remove constraint Publication Year Range: This year Publisher american institute of physics Remove constraint Publisher: american institute of physics
3 results on '"SCANNING electron microscopes"'

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1. Effect of straining on heat treated 304 austenitic stainless steel.

2. Inorganic oxides characteristics synthesized from natural limestone found in Aceh Province.

3. The influence of coupling agent on lnterfacial shear strength of Sansevieria cylindrica fiber-epoxy composite.

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