1. Cluster analysis on radio product integration testing faults
- Author
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Rytkönen, J. (Joel) and Rytkönen, J. (Joel)
- Abstract
Nowadays, when the different software systems keep getting larger and more complex, integration testing is necessary to ensure that the different components of the system work together correctly. With the large and complex systems the analysis of the test faults can be difficult, as there are so many components that can cause the failure. Also with the increased usage of automated tests, the faults can often be caused by test environment or test automation issues. Testing data and logs collected during the test executions are usually the main source of information that are used for test fault analysis. With the usage of text mining, natural language processing and machine learning methods, the fault analysis process is possible to be automated using the data and logs collected from the tests, as multiple studies have shown in the recent years. In this thesis, an exploratory data study is done on data collected from radio product integration tests done at Nokia. Cluster analysis is used to find the different fault types that can be found from each of the collected file types. Different feature extraction methods are used and evaluated in terms of how well they separate the data for fault analysis. The study done on this thesis paves the way for automated fault analysis in the future. The introduced methods can be applied for classifying the faults and the results and findings can be used to determine what are the next steps that can be taken to enable future implementations for automated fault analysis applications.Radiotuotteiden integraatiotestauksen vikojen klusterianalyysi. Tiivistelmä. Nykypäivänä, kun erilaiset ohjelmistojärjestelmät jatkavat kasvamista ja muuttuvat monimutkaisimmaksi, integraatiotestaus on välttämätöntä, jotta voidaan varmistua siitä, että järjestelmän eri komponentit toimivat yhdessä oikein. Suurien ja monimutkaisten järjestelmien testivikojen analysointi voi olla vaikeaa, koska järjestelmissä on mukana niin monta komponenttia, jotk
- Published
- 2023