1. Determination of critical diameters for intrinsic carrier diffusion-length of GaN nanorods with cryo-scanning near-field optical microscopy
- Author
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Jens Birch, Yen-Ting Chen, Per-Olof Holtz, and Karl Fredrik Karlsson
- Subjects
010302 applied physics ,Multidisciplinary ,Photoluminescence ,Materials science ,business.industry ,Near and far field ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,01 natural sciences ,Spectral line ,Article ,law.invention ,Optical microscope ,law ,0103 physical sciences ,Optoelectronics ,Nanorod ,Near-field scanning optical microscope ,Diffusion (business) ,0210 nano-technology ,business ,Luminescence ,Den kondenserade materiens fysik - Abstract
Direct measurements of carrier diffusion in GaN nanorods with a designed InGaN/GaN layer-in-a-wire structure by scanning near-field optical microscopy (SNOM) were performed at liquid-helium temperatures of 10 K. Without an applied voltage, intrinsic diffusion lengths of photo-excited carriers were measured as the diameters of the nanorods differ from 50 to 800 nm. The critical diameter of nanorods for carrier diffusion is concluded as 170 nm with a statistical approach. Photoluminescence spectra were acquired for different positions of the SNOM tip on the nanorod, corresponding to the origins of the well-defined luminescence peaks, each being related to recombination-centers. The phenomenon originated from surface oxide by direct comparison of two nanorods with similar diameters in a single map has been observed and investigated. Funding Agencies|Knut and Alice Wallenberg Foundation
- Published
- 2016