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1. A first-principles approach to closing the '10-100 eV gap' for charge-carrier thermalization in semiconductors

2. Response of a Commercial 0.25 um Thin-Film Silicon-on-Sapphire CMOS Technology to Total Ionizing Dose

3. High Energy Irradiation Effects on Silicon Photonic Passive Devices

4. Defect dynamics in the presence of excess energetic carriers and high electric fields in wide-gap semiconductors.

5. State-of-the-Art Flash Chips for Dosimetry Applications

9. Optical Response of Monolayer CdTe/CdS Quantum Dots to X-rays and Gamma-rays

10. Interfacial Effects on the Optical Properties of CdTe/CdS Quantum Dots

13. Random Telegraph Noise and Radiation Response of 80 nm Vertical Charge-Trapping NAND Flash Memory Devices With SiON Tunneling Oxide

15. Single-Event Burnout by Cf-252 Irradiation in Vertical $\beta$-Ga2O3 Diodes with Pt and PtOx Schottky Contacts and High Permittivity Dielectric Field Plate

17. Evaluating the Robustness of Complementary Channel Ferroelectric FETs Against Total Ionizing Dose Towards Radiation-Tolerant Embedded Nonvolatile Memory

19. Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics

20. Effects of Geometry and Cycling on the Radiation Response of Charge-Trapping NAND Memory Devices With SiON Tunneling Oxide

22. Evaluating the Robustness of Complementary Channel Ferroelectric FETs Against Total Ionizing Dose Toward Radiation-Tolerant Embedded Nonvolatile Memory

23. Low-Frequency Noise and Deep Level Transient Spectroscopy in n-p-n Si Bipolar Junction Transistors Irradiated With Si Ions

24. Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs

25. Effects of Interface Traps and Hydrogen on the Low-Frequency Noise of Irradiated MOS Devices

26. Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors With SiO₂ Oxygen-Penetration Layers

28. Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs

33. Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors

37. TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses

38. Effects of Layer-to-Layer Coupling on the Total-Ionizing-Dose Response of 3-D-Sequentially Integrated FD-SOI MOSFETs

44. Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand Devices

46. Damage Separation in Proton-Irradiated Bipolar Junction Transistors as a Function of Energy

47. Total-Ionizing-Dose Effects at Ultrahigh Doses in AlGaN/GaN HEMTs

49. Total-Ionizing-Dose Response of SiGe HBTs at Elevated Temperatures

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