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Your search keyword '"SCANNING electron microscopes"' showing total 15 results

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15 results on '"SCANNING electron microscopes"'

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1. High‐resolution strain mapping in a thermionic LaB6 scanning electron microscope.

2. Digital Image Correlation for Elastic Strain Evaluation during Focused Ion Beam Ring-Core Milling.

3. Classification of the acquisition conditions driving the accuracy of strain measurements during in situ DIC with scanning electron microscope.

4. Design and Application of a Miniature Pneumatic Bellows Loading Device for In-Situ Tensile Testing inside the Scanning Electron Microscope.

5. Detecting Carbon Nanotube Orientation with Topological Analysis of Scanning Electron Micrographs.

6. A Robust Patterning Technique for Electron Microscopy-Based Digital Image Correlation at Sub-Micron Resolutions.

7. Investigation on the characteristics of fracture process zone under cyclic loading: Insights from macro-mesoscopic analysis.

8. Identification of RVE length scale in fiber composites via combined optical and SEM digital image correlation.

9. Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope.

10. Large tensile deformation behavior of PC/ABS alloy

11. Automated identification of deformation twin systems in Mg WE43 from SEM DIC.

12. Using Digital Image Correlation on SEM Images of Strain Field after Ion Beam Milling for the Residual Stress Measurement of Thin Films.

13. Development of scanning electron microscope-compatible multiaxial miniature testing system.

14. Experiments and numerical simulations with the H-specimen on damage and fracture of ductile metals under non-proportional loading paths.

15. Comparing In Situ DIC Results from an Etched Surface with a Gold Speckled Surface.

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