1. Machine learning in industrial X-ray computed tomography – a review.
- Author
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Bellens, Simon, Guerrero, Patricio, Vandewalle, Patrick, and Dewulf, Wim
- Subjects
COMPUTED tomography ,MACHINE learning ,DEEP learning ,ARTIFICIAL intelligence ,EVIDENCE gaps ,IMAGE reconstruction - Abstract
X-ray computed tomography (XCT) has been shown to be a reliable tool for quality inspection, material evaluation, and dimensional measurement tasks across diverse academic and industrial applications. In recent years, the integration of machine learning and deep learning techniques have ushered new advances in the industrial computed tomography domain spanning multiple facets, including image reconstruction, segmentation, and feature characterization. This review paper comprehensively surveys the current state-of-the-art machine learning and deep learning applications throughout the entire XCT workflow. Additionally, we explore relevant developments in the medical imaging domain, evaluating their implications for industrial computed tomography. In conclusion, we identify potential future research, drawing insights from existing research gaps in the domain and recent advancements in artificial intelligence. Notably, we underscore the importance of uncertainty quantification and model explainability for further acceptance of artificial intelligence techniques in the domain. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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