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Metallic catalysts have emerged as prominent materials for graphene growth because the choice of the substrate significantly influences the properties of graphene. Among metallic catalysts, Cu is a highly promising catalytic substrate because it facilitates the growth of monolayer graphene. However, the growth process often induces strain and structural deformations that affect the electronic properties and device performance of graphene. In this study, we present the first observation of micropatterned strain domains in graphene grown on Cu substrates using chemical vapor deposition. Distinct strain‐induced shifts and broadening in the Raman peaks by employing Raman spectroscopy and atomic force microscopy are revealed, demonstrating the unique structural characteristics within the patterned domains. Furthermore, a strong correlation between the strain patterns in graphene and the facet structures of the underlying Cu surface is established. Our findings reveal intriguing variations in strain within the patterned domains and along the line boundaries, offering valuable insights into the intricate interactions between graphene and the Cu surface. These observed strain patterns and their spatial correlations with the Cu facet structures provide crucial guidance for designing graphene‐based devices with tailored strain engineering. [ABSTRACT FROM AUTHOR]