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Megavolt-class pulsed gas switches play an important role in large pulsers as transfer switches. This article analyzes the breakdown process and characteristics of a megavolt self-triggered preionized switch under 100-ns pulses based on the optical diagnosis. It is discovered that the triggering spark illumination targeting the main cathode or anode can separately preionize the main gap. The discharge channel is likely to first form between trigger electrodes and the main anode. Based on the above deduction, the streamer velocity is calculated to be $0.54 \times 10^{6}$ – $2.34 \times 10^{6}$ m/s, proportional to the electric field. Also, parameters of the empirical formula for calculating the gas heating time are amended. Influence mechanisms of the switch jitter are also studied. Under pulsed preionization mode, the trigger gap breaks down when the main gap electric field is high enough, and the switch jitter is mainly determined by the self-triggering jitter. Nonetheless, the self-triggering jitter can be partly offset during the breakdown process if the changing rate of mean reduced electric field $d(E/p)$ / dt at the self-triggering time is higher than 1.0 $1.0\left(\mathrm{kV} \cdot \mathrm{ns}^{-1} \cdot \mathrm{cm}^{-1} \cdot \mathrm{MPa}^{-1}\right)$. Under sustaining preionization mode, the trigger gap breaks down prematurely, and the continuous arcing driven by switch leak current preionizes the main gap. Therefore, the influence of the self-triggering jitter on the switch jitter can be eliminated. [ABSTRACT FROM AUTHOR]

The polymer film dielectric has been widely used in high voltage equipment for bulk insulation owing to the excellent insulation performance. Martin’s empirical formula for bulk breakdown is frequently used to predict the breakdown field strength of multilayer thin film with different electrode areas. In this article, based on the academic consensus that the cumulative breakdown probability of single-layer film obeys the Weibull distribution, the relationship between the cumulative breakdown probability of film dielectric under different electrode areas and the applied electrical field is deduced. Moreover, the relationship between the cumulative breakdown probability of film dielectric with various numbers of film layers and the applied electrical field is obtained and simplified. On these bases, combined with the experimental results of the average breakdown field of film dielectric with smaller electrode areas and fewer layers, a prediction model of the average breakdown field strength of film dielectric with different electrode areas and film layers is established. To obtain the solution of the prediction model concerning the number of film layer, an effective approximate solution method is proposed to solve the calculation problem with ultralarge and ultrasmall data, which significantly reduces the complexity of the solution process. A coaxial film capacitor is developed and tested to verify the prediction model with the “Chenguang” accelerator. The experimental breakdown field strength of 54 layers of 15 $\mu \text{m}$ biaxially oriented polypropylene (BOPP) film with an electrode area of 218.1 cm2 is 355.6 V/ $\mu \text{m}$ , which is comparable to the predicted result of 374 V/ $\mu \text{m}$. The prediction model presented in this article is of certain reference significance for the insulation design of film dielectrics. [ABSTRACT FROM AUTHOR]