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Raw data for "Imaging Cu2O nanocube hollowing in solution by quantitative in situ X-ray ptychography" Ptychographic data sets The file "raw_data_ptychography.zip" contains one HDF5 archive for each ptychographic scan. The archives are structured as follows: section experiment: identifiers of the lightsource, beamline, beamtime, session number, and scan number section measured: N diffraction patterns of size 512x512 px N scan positions in mm one detector mask of size 512x512 px slice separation in mm for multi slice reconstruction section parameters: distance between sample and detector in mm pixel size of detector in mm photon energy in keV cropping of diffraction patterns in px used during reconstruction The following list shows the scan numbers with their corresponding reaction times and slice separations for the in situ series measured at beamline P06 at 15.25 keV. scan number slice distance, mm reaction time, h 232 1 0.20 233 1 0.56 234 1 0.92 235 1 1.27 236 1 1.63 237 1 2.01 238 0.98 2.36 239 0.96 2.72 240 0.94 3.08 241 0.9 3.43 242 0.88 3.83 243 0.86 4.19 244 0.84 4.54 245 0.82 4.90 246 0.82 5.26 247 0.82 5.63 248 0.8 5.98 249 0.8 6.34 250 0.8 6.70 251 0.78 7.05 252 0.78 7.43 253 0.78 7.79 254 0.76 8.15 255 0.76 8.50 256 0.76 8.86 257 0.74 9.23 258 0.74 9.58 259 0.72 9.94 260 0.72 10.30 261 0.7 10.65 262 0.68 11.07 263 0.66 11.42 264 0.64 11.78 266 0.62 12.17 267 0.6 12.53 268 0.58 12.89 269 0.56 13.24 270 0.54 13.60 271 0.52 13.99 272 0.5 14.37 273 0.46 14.72 274 0.42 15.08 275 0.4 15.44 277 0.4 15.87 278 0.4 16.22 279 0.36 16.58 280 0.3 16.93 281 0.25 17.29 282 0.25 17.68 283 0.25 18.04 289 0.2 20.45 290 0.2 21.47 Ptychographic reconstructions The file "ptychographic_reconstructions.zip" contains the ptychographic reconstructions shown in the article and supplementary information in tiff format. Stacks of images corresponding to time series: P06_15.25_keV_scans_00232-00283_entrance_window_aligned.tif P06_15.25_keV_scans_00232-00283_exit_window_aligned.tif cSAXS_8.98_keV_scans_00200-00324_aligned.tif Single images (the file name indicates the respective figure): P06_15.25_keV_scan_00289_Figure_6_a.tif P06_15.25_keV_scan_00290_Supplementary_Figure_11.tif cSAXS_8.98_keV_scan_00347_Supplementary_Figure_13_d.tif cSAXS_8.98_keV_scan_00586_Supplementary_Figure_14_a.tif SEM images The file "SEM_images.zip" contains the SEM images shown in the article and supplementary information in tiff format. The file names indicate the respective figure: Figure_5_h.tif Figure_5_i.tif Figure_6_b.tif Supplementary_Figure_14_b.tif, Acknowledgements: This work was supported by the Bundesministerium für Bildung und Forschung (BMBF) within the Röntgen-Ångström-Cluster via the project 05K2020 - 2019-06104 XStereoVision (grant no. 05K20GUA), by the European Research Council within the project LINCHPIN (grant no. 818941), and by the Cluster of Excellence "CUI: Advanced Imaging of Matter" of the Deutsche Forschungsgemeinschaft (DFG) – EXC 2056 – project ID 390715994.

Optics express 30(18), 31519 - 31529 (2022). doi:10.1364/OE.454863, Diffraction-limited hard X-ray optics are key components for high-resolution microscopy, in particular for upcoming synchrotron radiation sources with ultra-low emittance. Diffractive optics like multilayer Laue lenses (MLL) have the potential to reach unprecedented numerical apertures (NA) when used in a crossed geometry of two one-dimensionally focusing lenses. However, minuscule fluctuations in the manufacturing process and technical limitations for high NA X-ray lenses can prevent a diffraction-limited performance. We present a method to overcome these challenges with a tailor-made refractive phase plate. With at-wavelength metrology and a rapid prototyping approach we demonstrate aberration correction for a crossed pair of MLL, improving the Strehl ratio from 0.41(2) to 0.81(4) at a numerical aperture of 3.3 × 10$^{−3}$. This highly adaptable aberration-correction scheme provides an important tool for diffraction-limited hard X-ray focusing., Published by Soc., Washington, DC

Advances in X-Ray/EUV Optics and Components XVII : [Proceedings] - SPIE, 2022. - ISBN 97815106546489781510654655 - doi:10.1117/12.2633458 Advances in X-Ray/EUV Optics and Components XVII, San Diego, United States, 21 Aug 2022 - 26 Aug 2022; Proceedings of SPIE 12240, 122400J (2022). doi:10.1117/12.2633458 special issue: "SPIE Optical Engineering + Applications", While modern x-ray microscopes at synchrotron radiation sources and free-electron lasers require x-ray optics of highest quality, these optics often show aberrations due to limitations in fabrication technology. Based on ptychography, we determine these aberrations and fabricate tailor made refractive phase plates to compensate for them. Starting from the aberrated optics, diffraction-limited beams can be generated by introducing the phase plate behind these optics. In addition, the wavefront can be modified to generate custom beams for special needs, such as donut-shaped beams with orbital angular momentum or for structured-illumination microscopy. The nanofocused beam can be engineered in shape and phase by introducing specially designed phase plates. We introduce a general scheme for wavefront engineering and illustrate it with a numerical example., Published by SPIE, Bellingham, Wash.

The European physical journal / Plus 137(12), 1312 (2022). doi:10.1140/epjp/s13360-022-03517-6, PETRA III at DESY is one of the brightest synchrotron radiation sources worldwide. It serves a broad international multidisciplinary user community from academia to industry at currently 25 specialised beamlines. With a storage ring energy of 6 GeV, it provides mainly hard to high-energy X-rays for versatile experiments in a very broad range of scientific fields. It is ideally suited for an upgrade to the ultra-low emittance source PETRA IV, owing to its large circumference of 2304 m. With a targeted storage ring emittance of 20 × 5 pm2 rad2, PETRA IV will reach spectral brightnesses two to three orders of magnitude higher than today. The unique beam parameters will make PETRAIV the ultimate in situ 3D microscope for biological, chemical and physical processes helping to address key questions in health, energy, mobility, information technology, and earth and environment., Published by Springer, Heidelberg

Materials 14(1), 228 (tbd). doi:10.3390/ma14010228, Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, the simultaneous assessment of composition, structure, and performance in four-fold multi-modality. Using scanning X-ray microscopy of a Cu(In,Ga)Se$_2$ (CIGS) solar cell, we measured the elemental distribution of the key absorber elements, the electrical and optical response, and the phase shift of the coherent X-rays with nanoscale resolution. We found structural features in the absorber layer—interpreted as voids—that correlate with poor electrical performance and point towards defects that limit the overall solar cell efficiency., Published by MDPI, Basel

DESY, Helmholtz Zentrum Berlin/Dresden 33 pp. (2021)., Published by DESY, Helmholtz Zentrum Berlin/Dresden