1. Upgrading of methylammonium lead halide perovskite layers by thermal imprint
- Author
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Kai Oliver Brinkmann, Frederic van gen Hassend, Hella-Christin Scheer, Neda Pourdavoud, Johannes Staabs, Patrick Görrn, Zineb Doukkali, Johannes Rond, Thomas Riedl, Ann-Christin Swertz, and Andre Mayer
- Subjects
Recrystallization (geology) ,Materials science ,02 engineering and technology ,General Chemistry ,Methylammonium lead halide ,010402 general chemistry ,021001 nanoscience & nanotechnology ,Hot pressing ,01 natural sciences ,Engineering physics ,0104 chemical sciences ,Crystal ,chemistry.chemical_compound ,Electron diffraction ,chemistry ,General Materials Science ,Grain boundary ,0210 nano-technology ,Layer (electronics) ,Perovskite (structure) - Abstract
The manufacturing of devices from methylammonium-based perovskites asks for reliable and scalable processing. As solvent engineering is not the option of choice to obtain homogeneous layers on large areas, our idea is to ‘upgrade’ a non-perfect pristine layer by recrystallization in a thermal imprint step (called ‘planar hot pressing’) and thus to reduce the demands on the layer formation itself. Recently, imprint has proven both its capability to improve the crystal size of perovskite layers and its usability for large area manufacturing. We start with methylammonium lead bromide layers obtained from a conventional solution-based process. Acetate is used as a competitive lead source; even under perfect conditions the resulting perovskite layer then will contain side-products due to layer formation besides the desired perovskite. Based on the physical properties of the materials involved we discuss the impact of the temperature on the status of the layer both during soft-bake and during thermal imprint. By using a special imprint technique called ‘hot loading’ we are able to visualize the upgrade of the layer with time, namely a growth of the grains and an accumulation of the side-products at the grain boundaries. By means of a subsequent vacuum exposition we reveal the presence of non-perovskite components with a simple inspection of the morphology of the layer; all experiments are supported by X-ray and electron diffraction measurements. Besides degradation, we discuss recrystallization and propose post-crystallization to explain the experimental results. This physical approach towards perovskite layers with large grains by post-processing is a key step towards large-area preparation of high-quality layers for device manufacturing.
- Published
- 2021
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