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11 results on '"Davidson, Jim L."'

6. Dose-Rate Effects on the Total-Ionizing-Dose Response of Piezoresistive Micromachined Cantilevers

Author

Arutt, Charles N., primary, Liao, Wenjun, additional, Gong, Huiqi, additional, Shuvra, Pranoy Deb, additional, Lin, Ji-Tzuoh, additional, Alles, Michael L., additional, Alphenaar, Bruce W., additional, Davidson, Jim L., additional, Walsh, Kevin M., additional, McNamara, Shamus, additional, Zhang, En Xia, additional, Sternberg, Andrew L., additional, Fleetwood, Daniel M., additional, Reed, Robert A., additional, and Schrimpf, Ronald D., additional

Published
2018
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7. Proton-Induced Displacement Damage and Total-Ionizing-Dose Effects on Silicon-Based MEMS Resonators

Author

Gong, Huiqi, primary, Liao, Wenjun, additional, Zhang, En Xia, additional, Sternberg, Andrew L., additional, McCurdy, Michael W., additional, Davidson, Jim L., additional, Reed, Robert A., additional, Fleetwood, Daniel M., additional, Schrimpf, Ronald D., additional, Shuvra, Pranoy Deb, additional, Lin, Ji-Tzuoh, additional, McNamara, Shamus, additional, Walsh, Kevin M., additional, Alphenaar, Bruce W., additional, and Alles, Michael L., additional

Published
2018
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9. The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Author

Massachusetts Institute of Technology. Department of Materials Science and Engineering, Hu, Juejun, Du, Qingyang, Arutt, Charles N, Alles, Michael L, Liao, Wenjun, Gong, Huiqi, Davidson, Jim L, Schrimpf, Ronald D, Reed, Robert A, Weller, Robert A, Bolotin, Kirill, Nicholl, Ryan, Pham, Thang Toan, Zettl, Alex, Li, Mo, Alphenaar, Bruce W, Lin, Ji-Tzuoh, Shurva, Pranoy Deb, McNamara, Shamus, Walsh, Kevin M, Feng, Philip X-L, Hutin, Louis, Ernst, Thomas, Homeijer, Brian D, Polcawich, Ronald G, Proie, Robert M, Jones, Jacob L, Glaser, Evan R, Cress, Cory D, Bassiri-Gharb, Nazanin, Massachusetts Institute of Technology. Department of Materials Science and Engineering, Hu, Juejun, Du, Qingyang, Arutt, Charles N, Alles, Michael L, Liao, Wenjun, Gong, Huiqi, Davidson, Jim L, Schrimpf, Ronald D, Reed, Robert A, Weller, Robert A, Bolotin, Kirill, Nicholl, Ryan, Pham, Thang Toan, Zettl, Alex, Li, Mo, Alphenaar, Bruce W, Lin, Ji-Tzuoh, Shurva, Pranoy Deb, McNamara, Shamus, Walsh, Kevin M, Feng, Philip X-L, Hutin, Louis, Ernst, Thomas, Homeijer, Brian D, Polcawich, Ronald G, Proie, Robert M, Jones, Jacob L, Glaser, Evan R, Cress, Cory D, and Bassiri-Gharb, Nazanin

Abstract

The potential of micro and nano electromechanical systems (M and NEMS) has expanded due to advances in materials and fabrication processes. A wide variety of materials are now being pursued and deployed for M and NEMS including silicon carbide (SiC), III–V materials, thin-film piezoelectric and ferroelectric, electro-optical and 2D atomic crystals such as graphene, hexagonal boron nitride (h-BN), and molybdenum disulfide (MoS₂). The miniaturization, functionality and low-power operation offered by these types of devices are attractive for many application areas including physical sciences, medical, space and military uses, where exposure to radiation is a reliability consideration. Understanding the impact of radiation on these materials and devices is necessary for applications in radiation environments., Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0027), Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0035), Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0036), Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0039), Defense Threat Reduction Agency (DTRA) (Grant HDTRA1-15-1-0060)

Published
2017

10. Total-Ionizing-Dose Effects in Piezoresistive Micromachined Cantilevers

Author

Gong, Huiqi, primary, Liao, Wenjun, additional, Zhang, En Xia, additional, Sternberg, Andrew L., additional, McCurdy, Michael W., additional, Davidson, Jim L., additional, Reed, Robert A., additional, Fleetwood, Daniel M., additional, Schrimpf, Ronald D., additional, Shuvra, Pranoy Deb, additional, Lin, Ji-Tzuoh, additional, McNamara, Shamus, additional, Walsh, Kevin M., additional, Alphenaar, Bruce W., additional, and Alles, Michael L., additional

Published
2017
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11. The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Author

Arutt, Charles N, primary, Alles, Michael L, additional, Liao, Wenjun, additional, Gong, Huiqi, additional, Davidson, Jim L, additional, Schrimpf, Ronald D, additional, Reed, Robert A, additional, Weller, Robert A, additional, Bolotin, Kirill, additional, Nicholl, Ryan, additional, Pham, Thang Toan, additional, Zettl, Alex, additional, Qingyang, Du, additional, Hu, Juejun, additional, Li, Mo, additional, Alphenaar, Bruce W, additional, Lin, Ji-Tzuoh, additional, Shurva, Pranoy Deb, additional, McNamara, Shamus, additional, Walsh, Kevin M, additional, Feng, Philip X-L, additional, Hutin, Louis, additional, Ernst, Thomas, additional, Homeijer, Brian D, additional, Polcawich, Ronald G, additional, Proie, Robert M, additional, Jones, Jacob L, additional, Glaser, Evan R, additional, Cress, Cory D, additional, and Bassiri-Gharb, Nazanin, additional

Published
2016
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