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33 results on '"Brodusch N"'

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7. Preferred orientations of laterally grown silicon films over amorphous substrates using the vapor-liquid-solid technique.

10. Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS).

11. Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materials.

12. ZAFG Method for Quantitative Characterization of Spherical Particles: Deriving a Universal Equation for Geometrical Correction.

14. Line-rotated remapping for high-resolution electron backscatter diffraction.

15. Phase differentiation based on x-ray energy spectrum correlation with an energy dispersive spectrometer (EDS).

16. Structural Study of Sulfur-Added Carbon Nanohorns.

17. Enhancing Singlet Oxygen Photocatalysis with Plasmonic Nanoparticles.

18. Scanning Electron Microscopy versus Transmission Electron Microscopy for Material Characterization: A Comparative Study on High-Strength Steels.

19. Extraction of 3D quantitative maps using EDS-STEM tomography and HAADF-EDS bimodal tomography.

20. Inverse modeling for quantitative X-ray microanalysis applied to 2D heterogeneous materials.

21. Core hole screened electron energy loss calculations of beam damaged lithium fluoride.

22. Investigation of the Effect of Magnification, Accelerating Voltage, and Working Distance on the 3D Digital Reconstruction Techniques.

23. Improvement of the energy resolution of energy dispersive spectrometers (EDS) using Richardson-Lucy deconvolution.

24. Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission mode.

25. Hollow silica capsules for amphiphilic transport and sustained delivery of antibiotic and anticancer drugs.

26. Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral Characterization.

27. About the contrast of δ' precipitates in bulk Al-Cu-Li alloys in reflection mode with a field-emission scanning electron microscope at low accelerating voltage.

28. The qualitative f-ratio method applied to electron channelling-induced x-ray imaging with an annular silicon drift detector in a scanning electron microscope in the transmission mode.

29. Characterization of Amorphous Oxide Nano-Thick Layers on 316L Stainless Steel by Electron Channeling Contrast Imaging and Electron Backscatter Diffraction.

30. Microstructure and Mechanical Properties of Ti Cold-Spray Splats Determined by Electron Channeling Contrast Imaging and Nanoindentation Mapping.

31. Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam milling.

32. Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope.

33. Microstructure refinement of cold-sprayed copper investigated by electron channeling contrast imaging.

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