107 results on '"Boyang Du"'
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2. Generalized Principal Component Analysis-Based Subspace Decomposition of Fault Deviations and Its Application to Fault Reconstruction
3. Novel criterion function for minor subspace tracking based on Rayleigh quotient
4. Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect
5. A Generalized Minor Component Extraction Algorithm and Its Analysis
6. Quality-Related and Process-Related Fault Monitoring With Online Monitoring Dynamic Concurrent PLS
7. Application of 3D Design Technology in the Construction of 220KV Miluoxi Substation
8. An Automated Continuous Integration Multitest Platform for Automotive Systems.
9. Adaptive LII-RMPLS based data-driven process monitoring scheme for quality-relevant fault detection.
10. MEGF-Net: multi-exposure generation and fusion network for vehicle detection under dim light conditions.
11. A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs.
12. An Effective Principal Singular Triplets Extracting Neural Network Algorithm.
13. On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA.
14. A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs.
15. An extended model to support detailed GPGPU reliability analysis.
16. On the evaluation of SEU effects in GPGPUs.
17. Unified and Self-Stabilized Parallel Algorithm for Multiple Generalized Eigenpairs Extraction.
18. About the functional test of the GPGPU scheduler.
19. SETA: A CAD Tool for Single Event Transient Analysis and Mitigation on Flash-Based FPGAs.
20. A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs.
21. A new CAD tool for Single Event Transient Analysis and mitigation on Flash-based FPGAs.
22. Fault tolerant electronic system design.
23. Online monitoring soft errors in reconfigurable FPGA during radiation test.
24. Effective Mitigation of Radiation-induced Single Event Transient on Flash-based FPGAs.
25. Consensus of Discrete-Time Linear Networked Multi-agent Systems Subject to Actuator Saturation
26. A Generalized Minor Component Extraction Algorithm and Its Analysis.
27. On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs.
28. Scalable FPGA graph model to detect routing faults.
29. An FPGA-based testing platform for the validation of automotive powertrain ECU.
30. A New Simulation-Based Fault Injection Approach for the Evaluation of Transient Errors in GPGPUs.
31. FPGA-controlled PCBA power-on self-test using processor's debug features.
32. Hybrid soft error mitigation techniques for COTS processor-based systems.
33. Consensus of Discrete-Time Linear Networked Multi-agent Systems Subject to Actuator Saturation.
34. Evaluation of transient errors in GPGPUs for safety critical applications: An effective simulation-based fault injection environment.
35. A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA.
36. SET-PAR: Place and Route Tools for the Mitigation of Single Event Transients on Flash-Based FPGAs.
37. On the design of highly reliable system-on-chip using dynamically reconfigurable FPGAs.
38. On the prediction of radiation-induced SETs in flash-based FPGAs.
39. Online Test of Control Flow Errors: A New Debug Interface-Based Approach.
40. On the mitigation of single event transients on flash-based FPGAs.
41. Radiation-induced single event transients modeling and testing on nanometric flash-based technologies.
42. Sparse Representation-Based DOA Estimation with Concentration Ratio Criteria
43. Consensus of Discrete-Time Linear Networked Multi-agent Systems Subject to Actuator Saturation
44. An Effective Principal Singular Triplets Extracting Neural Network Algorithm
45. A new EDA flow for the mitigation of SEUs in dynamic reconfigurable FPGAs.
46. Ultrahigh Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-Based FPGA
47. Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis
48. FlexGripPlus: An improved GPGPU model to support reliability analysis
49. A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits
50. Electron inducing soft errors in 28 nm system-on-Chip
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