1. Single-pixel positron beam diagnosis via compressive sampling.
- Author
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Xu, Jia-Yi, Kuang, Peng, Cao, Xing-Zhong, Liu, Fu-Yan, Zhang, Hong-Qiang, Yu, Xiao-Tian, Wang, Bao-Yi, and Wang, Hai-Ying
- Subjects
- *
POSITRON beams , *SIGNAL-to-noise ratio , *DIAGNOSIS methods , *POSITRONS , *PIXELS - Abstract
The morphology is a crucial indicator for diagnosing a low-energy, low-brightness particle beam. However, conventional positron beam diagnosis, based on the pixel scanning principle, is limited by physical constraints, such as the resolution of detector pixels. Here, we have presented a novel slow positron diagnosis method using compressive sampling. With a 100 × 100 pixel-sized mask, for example, the positron beam morphology can be significantly reconstructed with a peak signal-to-noise ratio of ∼40 dB, even at half the sampling rate compared to pixel scanning. It explores a promising approach for positron beam diagnosis with an ultra-high resolution and fast sampling rates. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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