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There are difficulties in the transmission electron microscope (TEM) sample preparation of SiC particles reinforced Al-based composite (SiC /Al) due to the complexity of phase constitute, since it needs positional sampling and large range of observation for studying the nexus between SiC and other constituted phases. In the present work, focused ion beam( FIB)with external picking up was chosen in making simple for TEM. The samples are made into sheet with large area in the vacuum chamber and removed and placed on an attached membrane net outside the vacuum chamber. A plurality of regions can be observed in single sample injection, due to there are multi-chip samples on an attached membrane net. The method was thus proven to be applicable to study the structure of SiC /Al by TEM. The mother can be used in other materials for high-efficiency and low-cow. [ABSTRACT FROM AUTHOR]