Descriptor: "focus ion beam" / Publication Type: eBooks - Searchworks@Jio Institute Digital Library Search Results

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Start Over Descriptor "focus ion beam" Publication Type eBooks

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1. Characterisation of Ga-distribution on a silicon wafer after inline FIB-preparation using inline ToFSIMS

Author: Muehle, U., Gaertner, R., Steinhoff, J., Zahn, W., Luysberg, Martina, editor, Tillmann, Karsten, editor, and Weirich, Thomas, editor
Published: 2008
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