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Your search keyword '"SCANNING electron microscopes"' showing total 3 results
Start Over Descriptor "SCANNING electron microscopes" Topic electron microscopes Publication Type Reviews
3 results on '"SCANNING electron microscopes"'

1. New helium microscope reveals startling details without frying the sample.

Author

Ivy Shih

Subjects
*PROTOTYPES, *HELIUM, *SCANNING electron microscopes, *ELECTRON microscopes
Abstract

The article offers information prototype scanning helium microscope (SHeM) developed by Paul Dastoor and his team at the University of Newcastle, in New South Wales which developed technology that uses a beam of neutral helium atoms to form images. It mentions prototype scanning helium microscope (SHeM) offers a more delicate touch than electron microscopes. It also mentions SHeM presents an opportunity to help further understanding of surface physics.

Published
2017

2. PHENOM-WORLD LAUNCHES NEW DESKTOP SEMS.

Author

Wagner, Larry

Subjects
*SCANNING electron microscopes, *ELECTRON microscopes, *EVALUATION
Abstract

The article offers information about the fifth-generation Phenom Pro and ProX SEMs from Phenom-World.

Published
2018

3. Wet-sample scanning electron microscope.

Subjects
*SCANNING electron microscopes, *ELECTRON microscopes, *NEW product development, *SCIENTIFIC apparatus & instruments
Abstract

Presents a product review of ISI's scanning electron microscope (SEM) that eliminates the need for many sample preparation steps such as fixing, dehydrating, critical point drying and coating. Operation of the Wet-SEM; Features of the instrument.

Published
1989

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