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Your search keyword '"SCANNING electron microscopes"' showing total 2 results
Start Over Descriptor "SCANNING electron microscopes" Search Limiters Full Text Publication Year Range Last 3 years Publication Type Reviews
2 results on '"SCANNING electron microscopes"'

1. LOW NOISE, TWO-CHANNEL STEM EBIC SYSTEM.

Author

Kolasa, Ted

Subjects
*TRANSMISSION electron microscopes, *SCANNING electron microscopes, *ELECTRON energy loss spectroscopy, *ELECTRONIC equipment
Abstract

The article reviews STEM EBIC SYSTEM from NanoElectronic Imaging (NEI) with advanced features for high-resolution imaging, conductivity, and temperature mapping.

Published
2023

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