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Grain boundary energies in different elements are correlated. The proportional scaling constants relating the energies of crystallography-equivalent boundaries in any two f.c.c. elements are nearly constant, with the notable exception of aluminum where these constants are known to vary significantly. However, the origins of the exceptional behavior of aluminum are not understood. Previously, we reported that for fcc metals there is a preference for boundaries to shift their tilt axis across the (1-10) plane towards [112] and to ultimately form low energy [112] core shifted boundaries (CSBs). By comparing grain boundary energies in copper and aluminum with different tilt axis in (1-10) plane, we now report the existence of a well-defined scaling behavior for the case of low angle boundaries. In contrast, the scaling constant for high angle boundaries is essentially fixed regardless of their tilt axis shift. This results in a gradual change in the scaling constants from low angle to high angle boundaries, which is responsible for the apparent exceptional scaling behavior found in aluminum. An analysis of structure evolution during core shifting points to the significance of boundary-core dissociation, a form of correlated relaxation of individual atoms at boundaries, in controlling the scaling of the boundary energies.

Grain boundaries with [111] tilt axes are common in polycrystalline face centered cubic metals. For copper (111) films, emergent grain boundaries close to surface have tilt axes that are shifted away from [111] that are lower in energy than the corresponding truncated bulk boundaries. Geometrical analysis and atomic calculations were used to study the driving force for this same relaxation phenomenon in representative fcc elemental metals. We show that the reduction in boundary energy scales with the elimination of energetically costly boundary core facets. We find that for a wide range of misorientation angles low energy core-shifted boundaries are also favored in Al, Ni, Au and Pt and discuss the significance for electromigration and other metal properties.

Emergent grain boundaries at free surface control material properties such as nanomaterial strength, catalysis, and corrosion. Recently the restructuring of emergent boundaries on copper (111) surfaces was discovered experimentally and atomic calculations point to its universality in fcc metal systems. Restructuring is due to a preference for boundaries to shift their tilt axis across the (1-10) plane towards [112] and ultimately to form low energy [112] core shifted boundaries (CSBs). However, the observed geometry of these emergent boundaries is not reproduced by atomic calculations and the driving force is still controversial due to inconsistencies between the computational continuum analysis and atomic calculations. Here, using atomic calculations that involve a methodical shift of the dislocation core, we confirmed the core shift of emergent boundaries observed in experiment and reconciled the atomic calculations with the elastic analysis through the inclusion of a straight wedge disclination at the free surface.

We prove an extended Granger-Johansen representation theorem (GJRT) for finite or infinite order integrated autoregressive time series on Banach space. We assume only that the resolvent of the autoregressive polynomial for the series is analytic on and inside the unit circle except for an isolated singularity at unity. If the singularity is a pole of finite order the time series is integrated of the same order. If the singularity is an essential singularity the time series is integrated of order infinity. When there is no deterministic forcing the value of the series at each time is the sum of an almost surely convergent stochastic trend, a deterministic term depending on the initial conditions and a finite sum of embedded white noise terms in the prior observations. This is the extended GJRT. In each case the original series is the sum of two separate autoregressive time series on complementary subspaces--a singular component which is integrated of the same order as the original series and a regular component which is not integrated. The extended GJRT applies to all integrated autoregressive processes irrespective of the spatial dimension, the number of stochastic trends and cointegrating relations in the system, and the order of integration., Comment: 29 pages, two figures, Preprint for article submitted for presentation at ANZESG 2023

Two-dimensional layered semiconductors have recently emerged as attractive building blocks for next-generation low-power non-volatile memories. However, challenges remain in the controllable sub-micron fabrication of bipolar resistively switching circuit components from these novel materials. Here we report on the scalable experimental realisation of lateral on-dielectric memtransistors from monolayer single-crystal molybdenum disulfide (MoS2) utilising a focused helium ion beam. Site-specific irradiation with the probe of a helium ion microscope (HIM) allows for the creation of charged defects in the MoS2 lattice. The reversible drift of these locally seeded defects in the applied electric field modulates the resistance of the semiconducting channel, enabling versatile memristive functionality on the nanoscale. We find the device can reliably retain its resistance ratios and set biases for hundreds of switching cycles at sweep frequencies of up to 2.9 V/s with relatively low drain-source biases. We also demonstrate long-term potentiation and depression with sharp habituation that promises application in future neuromorphic architectures. This work advances the down-scaling progress of memristive devices without sacrificing key performance parameters such as power consumption or its applicability for synaptic emulation., Comment: 37 pages, 5 main figures, 14 supplementary figures

Nanowire networks are promising memristive architectures for neuromorphic applications due to their connectivity and neurosynaptic-like behaviours. Here, we demonstrate a self-similar scaling of the conductance of networks and the junctions that comprise them. We show this behavior is an emergent property of any junction-dominated network. A particular class of junctions naturally leads to the emergence of conductance plateaus and a "winner-takes-all" conducting path that spans the entire network, and which we show corresponds to the lowest-energy connectivity path. These results point to the possibility of independently addressing memory or conductance states in complex systems and is expected to have important implications for neuromorphic devices based on reservoir computing., Comment: Additional supporting media will be available in other publishing venues

Precise tunability of electronic properties of 2D nanomaterials is a key goal of current research in this field of materials science. Chemical modification of layered transition metal dichalcogenides leads to the creation of heterostructures of low-dimensional variants of these materials. In particular, the effect of oxygen-containing plasma treatment on molybdenum disulfide (MoS$_2$) has long been thought to be detrimental to the electrical performance of the material. Here we show that the mobility and conductivity of MoS$_2$ can be precisely controlled and improved by systematic exposure to oxygen:argon plasma, and characterise the material utilising advanced spectroscopy and microscopy. Through complementary theoretical modelling which confirms conductivity enhancement, we uncover the role of a two-dimensional phase of molybdenum trioxide (2D-MoO$_3$) in improving the electronic behaviour of the material. Deduction of the beneficial role of MoO$_3$ will serve to open the field to new approaches with regard to the tunability of 2D semiconductors by their low-dimensional oxides in nano-modified heterostructures., Comment: 11 pages, 5 figures

The James Webb Space Telescope cryogenic testing requires measurement systems that both obtain a very high degree of accuracy and can function in that environment. Close-range photogrammetry was identified as meeting those criteria. Testing the capability of a close-range photogrammetric system prior to its existence is a challenging problem. Computer simulation was chosen over building a scaled mock-up to allow for increased flexibility in testing various configurations. Extensive validation work was done to ensure that the actual as-built system meet accuracy and repeatability requirements. The simulated image data predicted the uncertainty in measurement to be within specification and this prediction was borne out experimentally. Uncertainty at all levels was verified experimentally to be less than 0.1 millimeters.