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Light-emitting complex defects in silicon have been considered a potential platform for quantum technologies based on spin and photon degrees of freedom working at telecom wavelengths. Their integration in complex devices is still in its infancy, and it was mostly focused on light extraction and guiding. Here we address the control of the electronic states of carbon-related impurities (G-centers) via strain engineering. By embedding them in patches of silicon on insulator and topping them with SiN, symmetry breaking along [001] and [110] directions is demonstrated, resulting in a controlled splitting of the zero phonon line (ZPL), as accounted for by the piezospectroscopic theoretical framework. The splitting can be as large as 18 meV and it is finely tuned by selecting patch size or by moving in different positions on the patch. Some of the split, strained ZPLs are almost fully polarized and their overall intensity is enhanced up to 7 times with respect to the flat areas, whereas their recombination dynamics is slightly affected. Our technique can be extended to other impurities and Si-based devices such as suspended bridges, photonic crystal microcavities, Mie resonators, and integrated photonic circuits., Comment: 14 pages; 10 figures

Hydrogenation of nitrogen (N) doped GaAs allows for reversible tuning of the bandgap and the creation of site controlled quantum dots through the manipulation of N-nH complexes, N-nH complexes, wherein a nitrogen atom is surrounded by n hydrogen (H) atoms. Here we employ cross-sectional scanning tunneling microscopy (X-STM) to study these complexes in the GaAs (110) surface at the atomic scale. In addition to that we performed density functional theory (DFT) calculations to determine the atomic properties of the N-nH complexes. We argue that at or near the (110) GaAs surface two H atoms from N-nH complexes dissociate as an H$_2$ molecule. We observe multiple features related to the hydrogenation process, of which a subset is classified as N-1H complexes. These N-1H related features show an apparent reduction of the local density of states (LDOS), characteristic to N atoms in the GaAs (110) surface with an additional apparent localized enhancement of the LDOS located in one of three crystal directions. N-nH features can be manipulated with the STM tip. Showing in one case a switching behavior between two mirror-symmetric states and in another case a removal of the localized enhancement of the LDOS. The disappearance of the bright contrast is most likely a signature of the removal of an H atom from the N-nH complex., Comment: 11 pages, 12 figures

The electron transport layer (ETL) plays a fundamental role in perovskite solar cells. Recently, graphene-based ETLs have been proved to be good candidate for scalable fabrication processes and to achieve higher carrier injection with respect to most commonly used ETLs. In this work we experimentally study the effects of different graphene-based ETLs in sensitized MAPI solar cells. By means of time-integrated and picosecond time-resolved photoluminescence techniques, the carrier recombination dynamics in MAPI films embedded in different ETLs is investigated. Using graphene doped mesoporous TiO2 (G+mTiO2) with the addition of a lithium-neutralized graphene oxide (GO-Li) interlayer as ETL, we find that the carrier collection efficiency is increased by about a factor two with respect to standard mTiO2. Taking advantage of the absorption coefficient dispersion, we probe the MAPI layer morphology, along the thickness, finding that the MAPI embedded in the ETL composed by G+mTiO2 plus GO-Li brings to a very good crystalline quality of the MAPI layer with a trap density about one order of magnitude lower than that found with the other ETLs. In addition, this ETL freezes MAPI at the tetragonal phase, regardless of the temperature. Graphene-based ETLs can open the way to significant improvement of perovskite solar cells., Comment: 7 pages, 5 figures, Supporting Information

The doping of wide gap semiconductors is an interesting problem both from the scientific and technological point of view. A well known example of this problem is the doping of Cu$_2$O. The only element which has produced an order of magnitude increase in the conductivity of Cu$_2$O bulk samples is chlorine, as previously reported by us and others. However the solar cells produced with this material do not show any improvement in performances because of the reduction in the minority carrier diffusion length. In this paper we investigate the effect of other impurities in order to check their possible use as dopants and to assess their effects on the minority carrier diffusion length. Seven impurities have been introduced by evaporation on the starting copper sheet before the oxidation used to produce Cu$_2$O: chromium (Cr), iron (Fe), silver (Ag), silicon (Si), sodium (Na), sulfur (S) and phosphorus (P). The experiments show that a 20 ppm of concentration of these dopants does not give any relevant effect neither on the resistivity, nor on the mobility. The effect on minority carrier diffusion length is also negligible except for sodium which produces a slight degradation of the samples.