1. HR-EBSD analysis of in situ stable crack growth at the micron scale
- Author
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Koko, Abdalrhaman, Becker, Thorsten H., Elmukashfi, Elsiddig, Pugno, Nicola M., Wilkinson, Angus J., and Marrow, T. James
- Subjects
Condensed Matter - Materials Science - Abstract
Understanding the local fracture resistance of microstructural features. such as brittle inclusions, coatings, and interfaces at the microscale under complex loading conditions is critical for microstructure-informed design of materials. In this study, a novel approach has been formulated to decompose the J-integral evaluation of the elastic energy release rate to the three-dimensional stress intensity factors directly from experimental measurements of the elastic deformation gradient tensors of the crack field by in situ high (angular) resolution electron backscatter diffraction (HR-EBSD). An exemplar study is presented of a quasi-static crack, inclined to the observed surface, propagating on low index {hkl} planes in a (001) single crystal silicon wafer.
- Published
- 2022
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