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The single-event latch-up (SEL) cross section of a 16 nm bulk finFET programmable system-on-chip (SoC) is investigated by combining single-photon absorption (SPA) laser testing, emission microscopy (EMMI), and embedded instrumentation. The contributions of different SEL-sensitive areas identified by their current increase, light emission, and functional signatures are measured. The effect of temperature and IO bias is evaluated. The laser results show an excellent correlation with heavy ion data and delimit the origin of SEL in this device by excluding the occurrence of SEL in the core logic for this technology.

A new pulsed laser beam equipment dedicated to the characterization of integrated circuit is presented. Using ultra-short laser pulses is a convenient way to simulate experimentally the spatial environment of integrated circuits when interactions with heavy ions occur. This experimental set-up can be considered as a complementary tool for particle accelerators to evaluate the hardness assurance of integrated circuits for space applications. These particles generate temporally electrical disturbance called Single Event Effect (SEE). The theoretical approach of an equivalence between heavy ions and a laser pulses is discussed. The experimental set-up and some relevant operational methodologies are presented. Experimental results demonstrate that the induced electrical responses due to an heavy ion or a laser pulse are quite similar. Some sensitivity mappings of integrated circuits provided by this test bench illustrate the capabilities and the limitations of this laser-based technique. Contrary to the particle accelerators, it provides useful information concerning the spatial and temporal dependences of SEE mechanisms.

A new pulsed laser beam equipment dedicated to the characterization of integrated circuit is presented. Using ultra-short laser pulses is a convenient way to simulate experimentally the spatial environment of integrated circuits when interactions with heavy ions occur. This experimental set-up can be considered as a complementary tool for particle accelerators to evaluate the hardness assurance of integrated circuits for space applications. These particles generate temporally electrical disturbance called Single Event Effect (SEE). The theoretical approach of an equivalence between heavy ions and a laser pulses is discussed. The experimental set-up and some relevant operational methodologies are presented. Experimental results demonstrate that the induced electrical responses due to an heavy ion or a laser pulse are quite similar. Some sensitivity mappings of integrated circuits provided by this test bench illustrate the capabilities and the limitations of this laser-based technique. Contrary to the particle accelerators, it provides useful information concerning the spatial and temporal dependences of SEE mechanisms.

The cross section of ICs extracted from particles accelerator testing is extended to the pulsed laser testing. The extraction methodology attached to this new parameter is presented. It provides a new tool for integrated circuits reliability quantification, illustrated in the case of SEU sensitivity evaluation of a single SRAM cell.