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Solar cells made from multicrystalline silicon material, which still represent the majority of solar cells produced today, are by nature inhomogeneous devices. Their bulk excess carrier lifetime, which decisively influences the short circuit current density, the saturation current density, and the effective bulk diffusion length, may vary from position to position by an order of magnitude or more. Moreover, such cells may contain ohmic shunts and, in particular in the edge regions, positions of significant depletion region recombination current. The classical local characterization method for solar cells is light beam‐induced current (LBIC) mapping. This method does not give direct information on factors influencing the dark current density. A reliable quantitative local characterization of inhomogeneous cells can be performed by combining dark lock‐in thermography (DLIT) with electro‐ and photoluminescence (EL and PL) imaging. In this contribution, the well‐established and the most recent findings on the application of these methods are reviewed and typical application examples are presented. It is shown that luminescence imaging is most appropriate for local series resistance imaging and for qualitatively imaging of all kinds of recombination‐active defects. DLIT, on the other hand, shows a lower spatial resolution, but is most appropriate for imaging local two‐diode parameters like depletion region‐ and bulk saturation current densities, the latter allowing to draw conclusions also to the local short circuit current density. A comprehensive local characterization of silicon solar cells is possible by applying both DLIT and luminescence imaging, which complement each other. The three most important imaging methods for solar cell characterization, light beam‐induced current (LBIC), lock‐in thermography, and luminescence imaging are reviewed. It is described how the primary images obtained from these methods may be converted into images of physically relevant cell parameters. A particular proof of the correctness of such conversions is if one parameter is imaged identically by two of the methods. The image shows the distribution of the short circuit current density (Jsc) measured by LBIC and photoluminescence.