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This paper addresses semi-supervised semantic segmentation by exploiting a small set of images with pixel-level annotations (strong supervisions) and a large set of images with only image-level annotations (weak supervisions). Most existing approaches aim to generate accurate pixel-level labels from weak supervisions. However, we observe that those generated labels still inevitably contain noisy labels. Motivated by this observation, we present a novel perspective and formulate this task as a problem of learning with pixel-level label noise. Existing noisy label methods, nevertheless, mainly aim at image-level tasks, which can not capture the relationship between neighboring labels in one image. Therefore, we propose a graph based label noise detection and correction framework to deal with pixel-level noisy labels. In particular, for the generated pixel-level noisy labels from weak supervisions by Class Activation Map (CAM), we train a clean segmentation model with strong supervisions to detect the clean labels from these noisy labels according to the cross-entropy loss. Then, we adopt a superpixel-based graph to represent the relations of spatial adjacency and semantic similarity between pixels in one image. Finally we correct the noisy labels using a Graph Attention Network (GAT) supervised by detected clean labels. We comprehensively conduct experiments on PASCAL VOC 2012, PASCAL-Context and MS-COCO datasets. The experimental results show that our proposed semi supervised method achieves the state-of-the-art performances and even outperforms the fully-supervised models on PASCAL VOC 2012 and MS-COCO datasets in some cases.

Fine-grained image classification remains challenging due to the large intra-class variance and small inter-class variance. Since the subtle visual differences are only in local regions of discriminative parts among subcategories, part localization is a key issue for fine-grained image classification. Most existing approaches localize object or parts in an image with object or part annotations, which are expensive and labor-consuming. To tackle this issue, we propose a fully unsupervised part mining (UPM) approach to localize the discriminative parts without even image-level annotations, which largely improves the fine-grained classification performance. We first utilize pattern mining techniques to discover frequent patterns, i.e., co-occurrence highlighted regions, in the feature maps extracted from a pre-trained convolutional neural network (CNN) model. Inspired by the fact that these relevant meaningful patterns typically hold appearance and spatial consistency, we then cluster the mined regions to obtain the cluster centers and the discriminative parts surrounding the cluster centers are generated. Importantly, any annotations and sophisticated training procedures are not used in our proposed part localization approach. Finally, a multi-stream classification network is built for aggregating the original, object-level and part-level features simultaneously. Compared with other state-of-the-art approaches, our UPM approach achieves the competitive performance., Comment: 10 pages,4 figures

TThe goal of our work is to discover dominant objects in a very general setting where only a single unlabeled image is given. This is far more challenge than typical co-localization or weakly-supervised localization tasks. To tackle this problem, we propose a simple but effective pattern mining-based method, called Object Location Mining (OLM), which exploits the advantages of data mining and feature representation of pre-trained convolutional neural networks (CNNs). Specifically, we first convert the feature maps from a pre-trained CNN model into a set of transactions, and then discovers frequent patterns from transaction database through pattern mining techniques. We observe that those discovered patterns, i.e., co-occurrence highlighted regions, typically hold appearance and spatial consistency. Motivated by this observation, we can easily discover and localize possible objects by merging relevant meaningful patterns. Extensive experiments on a variety of benchmarks demonstrate that OLM achieves competitive localization performance compared with the state-of-the-art methods. We also evaluate our approach compared with unsupervised saliency detection methods and achieves competitive results on seven benchmark datasets. Moreover, we conduct experiments on fine-grained classification to show that our proposed method can locate the entire object and parts accurately, which can benefit to improving the classification results significantly.