1. STAHL: A Novel Scan-Test-Aware Hardened Latch Design
- Author
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Kyushu Institute of Technology, Iizuka 820-8502, Japan, Anhui University, Hefei 230601, P. R. China, Anhui University of Science & Technology, Huainan 232000, P. R. China, Ma, Ruijun, Holst, Stefan, Wen, Xiaoqing, Yan, Aibin, Xu, Hui, Kyushu Institute of Technology, Iizuka 820-8502, Japan, Anhui University, Hefei 230601, P. R. China, Anhui University of Science & Technology, Huainan 232000, P. R. China, Ma, Ruijun, Holst, Stefan, Wen, Xiaoqing, Yan, Aibin, and Xu, Hui
- Abstract
type:Journal Article, As modern technology nodes become more susceptible to soft errors, many radiation hardened latch designs have been proposed. However, redundant circuitry used to tolerate soft errors in such hardened latches also reduces the test coverage of cell-internal manufacturing defects. To avoid potential test escapes that lead to soft error vulnerability and reliability issues, this paper proposes a novel Scan-Test-Aware Hardened Latch (STAHL). Simulation results show that STAHL has superior defect coverage compared to previous hardened latches while maintaining full radiation hardening in function mode., 24th IEEE European Test Symposium (ETS'19), May 27-31, 2019, Baden-Baden, Germany
- Published
- 2020