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1. Porous Silicon: when void enables new Si application fields

Author

UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, Scheen, G., Rasson, J., Belaroussi, Y., Poncelet, O., Majoul, N., Raskin, Jean-Pierre, Francis, Laurent, Third Winfab Scientific Day, UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, Scheen, G., Rasson, J., Belaroussi, Y., Poncelet, O., Majoul, N., Raskin, Jean-Pierre, Francis, Laurent, and Third Winfab Scientific Day

Published
2016

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