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Teflon film was prepared by ion beam enhanced deposition method. The structure and microtribological properties were studied by PHI-5300, FT-IR, XRD and atomic force and friction force microscope (AFM/FFM). The results show that the deposited Teflon is in crystalline state, and its structure is the same as the bulk Teflon. There are two periods in the friction and wear tests for Teflon film. When the load is less than 70 nN, the micro friction force is linear with the load, and the Teflon does not have the lubricity. But when the load is greater than 70 nN, the friction force of Teflon film will stay nearly constant, and worn marks will be created in the friction and wear process. The worn depth of Teflon film increases linearly with the load.

Micro-assembling Teflon/Si3N4 multilayer film was developed by ion beam alternating sputtering Teflon and Si3N4 ceramic targets. The structural, mechanical and microtribological properties were studied by PHI-5300, FTIR, XRD and atomic force and friction force microscope (AFM/FFM). The results show that the multilayer consists of Si3N4 component and crystalline Teflon. The hardness of the multilayer is less than that of Si3N4; but the toughness of Teflon/Si3N4 is greatly improved. The friction coefficient of Teflon/Si3N4 multilayer is lower than that of Si3N4 film, and the wear resistance of Teflon/Si3N4 multilayer is much greater than that of Teflon film. The friction force of Teflon/ Si3N4 film is linear with the load in nanoscale. The worn track will be formed in Teflon and Teflon/Si3N4 film when the load is greater than 70 nN. (C) 1999 Published by Elsevier Science Ltd. All rights reserved.

Micro-assembling Teflon/Si3N4 multilayer film was developed by ion beam alternating sputtering Teflon and Si3N4 ceramic targets. The structural, mechanical and microtribological properties were studied by PHI-5300, FTIR, XRD and atomic force and friction force microscope (AFM/FFM). The results show that the multilayer consists of Si3N4 component and crystalline Teflon. The hardness of the multilayer is less than that of Si3N4; but the toughness of Teflon/Si3N4 is greatly improved. The friction coefficient of Teflon/Si3N4 multilayer is lower than that of Si3N4 film, and the wear resistance of Teflon/Si3N4 multilayer is much greater than that of Teflon film. The friction force of Teflon/ Si3N4 film is linear with the load in nanoscale. The worn track will be formed in Teflon and Teflon/Si3N4 film when the load is greater than 70 nN. (C) 1999 Published by Elsevier Science Ltd. All rights reserved.

Teflon film was prepared by ion beam enhanced deposition method. The structure and microtribological properties were studied by PHI-5300, FT-IR, XRD and atomic force and friction force microscope (AFM/FFM). The results show that the deposited Teflon is in crystalline state, and its structure is the same as the bulk Teflon. There are two periods in the friction and wear tests for Teflon film. When the load is less than 70 nN, the micro friction force is linear with the load, and the Teflon does not have the lubricity. But when the load is greater than 70 nN, the friction force of Teflon film will stay nearly constant, and worn marks will be created in the friction and wear process. The worn depth of Teflon film increases linearly with the load.

Teflon film was prepared by ion beam enhanced deposition method. The structure and microtribological properties were studied by PHI-5300, FT-IR, XRD and atomic force and friction force microscope (AFM/FFM). The results show that the deposited Teflon is in crystalline state, and its structure is the same as the bulk Teflon. There are two periods in the friction and wear tests for Teflon film. When the load is less than 70 nN, the micro friction force is linear with the load, and the Teflon does not have the lubricity. But when the load is greater than 70 nN, the friction force of Teflon film will stay nearly constant, and worn marks will be created in the friction and wear process. The worn depth of Teflon film increases linearly with the load.

Micro-assembling Teflon/Si3N4 multilayer film was developed by ion beam alternating sputtering Teflon and Si3N4 ceramic targets. The structural, mechanical and microtribological properties were studied by PHI-5300, FTIR, XRD and atomic force and friction force microscope (AFM/FFM). The results show that the multilayer consists of Si3N4 component and crystalline Teflon. The hardness of the multilayer is less than that of Si3N4; but the toughness of Teflon/Si3N4 is greatly improved. The friction coefficient of Teflon/Si3N4 multilayer is lower than that of Si3N4 film, and the wear resistance of Teflon/Si3N4 multilayer is much greater than that of Teflon film. The friction force of Teflon/ Si3N4 film is linear with the load in nanoscale. The worn track will be formed in Teflon and Teflon/Si3N4 film when the load is greater than 70 nN. (C) 1999 Published by Elsevier Science Ltd. All rights reserved.

The reaction of excimer laser (XeCl, 308 nm ) vaporized and excited fullerene C-60 With La was carried out in a mixture of C-60 and La2O3. The reaction products La@C-60, La@C-60-2n and La@C-60+2m were identified by a reflectron type time-of-flight mass spectrometer (RTOFMS). This work provides a first experimental evidence of endohedral metallofullerene formation by letting a La atom penetrate into the C-60 cage through a sort of `window' mechanism.

The reaction of excimer laser (XeCl, 308 nm ) vaporized and excited fullerene C-60 With La was carried out in a mixture of C-60 and La2O3. The reaction products La@C-60, La@C-60-2n and La@C-60+2m were identified by a reflectron type time-of-flight mass spectrometer (RTOFMS). This work provides a first experimental evidence of endohedral metallofullerene formation by letting a La atom penetrate into the C-60 cage through a sort of `window' mechanism.

The reaction of excimer laser (XeCl, 308 nm ) vaporized and excited fullerene C-60 With La was carried out in a mixture of C-60 and La2O3. The reaction products La@C-60, La@C-60-2n and La@C-60+2m were identified by a reflectron type time-of-flight mass spectrometer (RTOFMS). This work provides a first experimental evidence of endohedral metallofullerene formation by letting a La atom penetrate into the C-60 cage through a sort of `window' mechanism.