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Start Over Author "Kruchinin, V." Publication Type Electronic Resources
4 results on '"Kruchinin, V."'

1. Nanoscale Potential Fluctuations in Zirconium Oxide and the Flash Memory Based on Such Fluctuations

Author

Gritsenko, V. A., Perevalov, T. V., Kruchinin, V. N., Aliev, V. S., Gerasimova, A. K., Erenburg, S. B., Trubina, S. V., Kvashnina, K. O., Prosvirin, I. P., Gritsenko, V. A., Perevalov, T. V., Kruchinin, V. N., Aliev, V. S., Gerasimova, A. K., Erenburg, S. B., Trubina, S. V., Kvashnina, K. O., and Prosvirin, I. P.

Abstract

X-ray photoelectron spectroscopy, EXAFS, XANES, spectral ellipsometry and quantum-chemistry calculations were used to examine the atomic and electronic structure of non-stoichiometric amorphous ZrOx slightly enriched with zirconium. The experimental data show that the ZrOx material consists of stoichiometric ZrO2, metallic Zr and zirconium suboxides ZrOy. The structure of ZrOx is analyzed using the Random Bonding and Random Mixture models. A model of nanoscale spatial potential fluctuations in ZrOx is substantiated. In this model, the potential fluctuations for electrons and holes arise due to the local fluctuations of bandgap energy in the range from 0 to 5.4 eV. A ZrOx-based flash memory element with giant retention time is proposed

Published
2018

2. Nanoscale Potential Fluctuations in Zirconium Oxide and the Flash Memory Based on Such Fluctuations

Author

Gritsenko, V. A., Perevalov, T. V., Kruchinin, V. N., Aliev, V. S., Gerasimova, A. K., Erenburg, S. B., Trubina, S. V., Kvashnina, K. O., Prosvirin, I. P., Gritsenko, V. A., Perevalov, T. V., Kruchinin, V. N., Aliev, V. S., Gerasimova, A. K., Erenburg, S. B., Trubina, S. V., Kvashnina, K. O., and Prosvirin, I. P.

Abstract

X-ray photoelectron spectroscopy, EXAFS, XANES, spectral ellipsometry and quantum-chemistry calculations were used to examine the atomic and electronic structure of non-stoichiometric amorphous ZrOx slightly enriched with zirconium. The experimental data show that the ZrOx material consists of stoichiometric ZrO2, metallic Zr and zirconium suboxides ZrOy. The structure of ZrOx is analyzed using the Random Bonding and Random Mixture models. A model of nanoscale spatial potential fluctuations in ZrOx is substantiated. In this model, the potential fluctuations for electrons and holes arise due to the local fluctuations of bandgap energy in the range from 0 to 5.4 eV. A ZrOx-based flash memory element with giant retention time is proposed

Published
2018

3. Short-Range Order in Amorphous and Crystalline Ferroelectric Hf0.5Zr0.5O2

Author

Erenburg, S. B., Trubina, S. V., Kvashnina, K. O., Kruchinin, V. N., Gritsenko, V. V., Chernikova, A. G., Markeev, A. M., Erenburg, S. B., Trubina, S. V., Kvashnina, K. O., Kruchinin, V. N., Gritsenko, V. V., Chernikova, A. G., and Markeev, A. M.

Abstract

The microstructures of amorphous and polycrystalline ferroelectric Hf0.5Zr0.5O2 films are studied by X-ray spectroscopy and ellipsometry. EXAFS spectra demonstrate that the amorphous film consists of an “incompletely mixed” solid solution of metallic oxides HfO2 and ZrO2. After rapid thermal annealing, the mixed Hf0.5Zr0.5O2 oxide films have a more ordered polycrystalline structure, and individual Hf and Zr monoxide islands form in the films. These islands are several nanometers in size and have a structure that is similar to the monoclinic structure of HfO2 and ZrO2. The presence of the HfO2 and ZrO2 phases in the Hf0.5Zr0.5O2 films is also detected by ellipsometry

Published
2018

4. Short-Range Order in Amorphous and Crystalline Ferroelectric Hf0.5Zr0.5O2

Author

Erenburg, S. B., Trubina, S. V., Kvashnina, K. O., Kruchinin, V. N., Gritsenko, V. V., Chernikova, A. G., Markeev, A. M., Erenburg, S. B., Trubina, S. V., Kvashnina, K. O., Kruchinin, V. N., Gritsenko, V. V., Chernikova, A. G., and Markeev, A. M.

Abstract

The microstructures of amorphous and polycrystalline ferroelectric Hf0.5Zr0.5O2 films are studied by X-ray spectroscopy and ellipsometry. EXAFS spectra demonstrate that the amorphous film consists of an “incompletely mixed” solid solution of metallic oxides HfO2 and ZrO2. After rapid thermal annealing, the mixed Hf0.5Zr0.5O2 oxide films have a more ordered polycrystalline structure, and individual Hf and Zr monoxide islands form in the films. These islands are several nanometers in size and have a structure that is similar to the monoclinic structure of HfO2 and ZrO2. The presence of the HfO2 and ZrO2 phases in the Hf0.5Zr0.5O2 films is also detected by ellipsometry

Published
2018

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