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Modern industrial plant operations often require accurate level measurement of process liquids in production and storage vessels. A variety of advanced level indicators are commercially available to meet the demand, but these may not suit specific need of situations. The neutron backscatter technique is exceptionally useful for occasional and routine determination, particularly in situations such as pressure vessel with wall thickness up to 10 cm, toxic and corrosive chemical in sealed containers, liquid petroleum gas storage vessels. In level measurement, high energy neutrons from 241Am-Be radioactive source are beamed onto a vessel. Fast neutrons are slowed down mostly by collision with hydrogen atoms of material inside the vessel. Parts of thermal neutron are bounced back towards the source. By placing a thermal detector next to the source, these backscatter neutrons can be measured. The number of backscattered neutrons is directly proportional to the concentration of the hydrogen atoms in front of the neutron detector. As the source and detector moved by the matrix around the side of the vessel, interfaces can be determined as long as it involves a change in hydrogen atom concentration. This paper presents the slow neutron mapping technique to indicate level interface of a test vessel. [ABSTRACT FROM AUTHOR]

A non-zero value of the R-correlation coefficient due to the e - polarization component, perpendicular to the plane spanned by the spin of the decaying neutron and the electron momentum, would signal a violation of time reversal symmetry and thus physics beyond the Standard Model. The value of the N-correlation coefficient, given by the transverse e - polarization component within that plane, is expected to be finite. The measurement of N serves as an important systematic check of the apparatus for the R-measurement. The first phase of data taking has been completed. Preliminary results from a limited data sample show no deviations from the Standard Model predictions. © 2006 American Institute of Physics [ABSTRACT FROM AUTHOR]