19 results on '"Yin, Lianghong"'
Search Results
2. Machine learning based error classification for curvilinear designs
3. Real-time full-wafer design-based inter-layer virtual metrology
4. Stochastic model prediction of pattern-failure
5. Process window-based feature and die failure rate prediction
6. Machine learning assisted effective OPC verification hotspot capture.
7. Combinational optical rule check on hotspot detection
8. Impact of aberrations in EUV lithography: metal to via edge placement control
9. Process window tripling by optimized SRAF placement rules: AP/DFM: Advanced patterning/design for manufacturability
10. Fabrication and characterization of parallel-coupled dual racetrack silicon microresonators
11. Ultra-high sensitivity in a photonic crystal superprism due to the curvature singularity of a dispersion surface
12. Ultrafast Kerr switching in a silicon waveguide
13. Realization of an Ultrafast Silicon Kerr Switch
14. Design of An Optical Kerr Shutter Using Silicon Waveguides
15. Soliton Fission and Continuum Generation in Silicon Waveguides
16. Machine learning based error classification for curvilinear designs.
17. Stochastic model prediction of pattern-failure.
18. Real-time full-wafer design-based inter-layer virtual metrology.
19. Ultra-high sensitivity in a photonic crystal superprism due to the curvature singularity of a dispersion surface.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.