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192 results on '"Wakabayashi, H."'

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1. Accurate TCAD simulation of trench-gate IGBTs and its application to prediction of carrier lifetime requirements for future scaled devices

2. Modeling and Simulation of Si IGBTs

5. Switching of 3300V Scaled IGBT by 5V Gate Drive

8. Normally-Off Sputtered-MoS2 nMISFETs with MoSi2 Contact by Sulfur Powder Annealing and ALD Al2O3 Gate Dielectric for Chip Level Integration

9. Vertical Bipolar Transistor Test Structure for Measuring Minority Carrier Lifetime in IGBTs

12. Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately

13. New Methodology for Evaluating Minority Carrier Lifetime for Process Assessment

18. 3D scaling for insulated gate bipolar transistors (IGBTs) with low Vce(sat)

19. Demonstration of Reduction in Vce (sat) of IGBT based on a 3D Scaling Principle

27. Experimental verification of a 3D scaling principle for low Vce(sat) IGBT

38. Passivation of SiO2/SiC interface with La2O3 capped oxidation

39. Multi-Layered MoS2 Thin Film Formed by High-Temperature Sputtering for Enhancement-Mode nMOSFETs

46. A Proposal of a Forming-Free Resistive Switching Memory based on Breakdown and Anodic Reoxidization of thin SiO2 on NiSi2 Electrode using CeOx Buffer Layer

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