8 results on '"Shaneyfelt, Marty R."'
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2. Hardness assurance testing for proton direct ionization effects
3. SOI substrate removal for SEE characterization: Techniques and applications
4. Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
5. Effects of moisture on radiation-induced degradation in CMOS SOI transistors
6. Heavy ion testing at the galactic cosmic ray energy peak
7. Test procedures for proton-induced single event latchup in space environments
8. Elimination of Enhanced Low-Dose-Rate Sensitivity in Linear Bipolar Devices Using Silicon-Carbide Passivation
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