27 results on '"Rummel, Andreas"'
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2. Power Semiconductor Failure Analysis Tutorial
3. Combining Three-Dimensional FIB-SEM Imaging and EBIC to Characterize Power Semiconductor Junctions
4. In-Situ Junction Analysis in SiC (and GaN)
5. In-situ EBIC measurements of IGBT during device turn-on
6. Improved electrical characterization of transistors manufactured in small technology nodes
7. In-situ measurement of depletion zones in power devices
8. Simple Methods for Evaluating Junctions in IGBTs
9. Zero Channel Bias Determination of Device Turn-On and the Seebeck Effect in Nanoprobing
10. Optimizing EBAC / EBIRCH analysis in 5 nm technology
11. EBIRCH Localization for Low-Current Soft Fails
12. Low-voltage EBIC investigation of fails
13. Finding Invisible Cracks via Nano-Probing
14. One-chamber workflow for STEM examination of EBIRCH-localized defects : YE: Yield Enhancement/Learning
15. Locating low-ohmic Variations in Resistance using Electron Beam Induced Voltage Imaging
16. Probing SRAM Signals for Yield Management
17. Distinguishing between electron-beam signals in probing of SRAM modules for yield management
18. SEM-Based Nanoprobing on In-Situ Delayered Advanced 10 nm Technology Node IC
19. Physical fault isolation of complex BEOL defects in advanced microprocessors using EBAC technique in nano-prober
20. Combining Current Imaging, EBIC/EBAC, and Electrical Probing for Fast and Reliable In-Situ Electrical Fault Isolation
21. Combining current imaging, EBIC/EBAC, and electrical probing for fast and reliable in situ electrical fault isolation
22. Resistive Contrast Imaging—The Tool, Technique, and Applications on Leading-Edge Semiconductor Technology Devices
23. Towards the Understanding of Resistive Contrast Imaging in In Situ Dielectric Breakdown Studies using a Nanoprober Setup.
24. Combined Planar Measurements of Flow Velocity and Mass Concentration in Shallow Turbulent Flow Part 1: Development of a Planar Concentration Analysis (PCA) System.
25. Combined Planar Measurements of Flow Velocity and Mass Concentration in Shallow Turbulent Flow Part 2: Application of Coupled PIV-PCA to Turbulent Shallow Wake Flows.
26. Correction for transmitter vibrations in laser scintillation measurements
27. Correction for transmitter vibrations in laser scintillation measurements.
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