Search

Magnetoresistive Sr2FeMoO6 thin films were grown by pulsed laser deposition with three different thicknesses 150 nm, 270 nm and 500 nm. Structural, magnetic and magneto-transport properties of the films were measured. Structural properties showed that impurity phases are formed when the film thickness exceed limiting thickness over 300 nm. Otherwise no major differences were observed in structural and magnetic properties between the films. The semiconductive upturn was observed in all ρ(T) curves, but it was notably smaller for the two thickest films. At 350 K the magnetoresistive (MR) behaviour was very similar for all the films, but at 10 K the negative MR was clearly largest for the thickest film and also the shape of the curve in low fields deviated from others. [ABSTRACT FROM AUTHOR]