23 results on '"Naka, N."'
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2. Low Temperature (< 130oC) Formation of Crystalline Ge Film on Insulator by Stress Stimulated GILC
3. Standardization of the new 3GPP EVS codec
4. Stress Field and Defect Evaluation with Shallow Trench Isolation Structure after Transistor Fabrication Processing by Raman and Cathodoluminescence Spectroscopies
5. Cathodoluminescence spectroscopy study for non-destructive stress analysis of thermal silicon-oxide film
6. Raman Spectroscopic Metrology for Stress measurement in Semiconductor Device Development and Process
7. Uniaxial Tensile Testing System for Quantitative Stress Analysis in Silicon Oxide Thin Films by Cathodoluminescence Spectroscopy
8. Non-Destructive Quantitative Measurement Method for Normal and Shear Stresses on Single-Crystalline Silicon Structures for Reliability of Silicon-MEMS
9. Raman Spectroscopic Stress Analysis of Single Crystal Silicon (001) Specimen Tensioned Along the [100] Direction over 1000 MPa
10. Direct Observation of Tensile Stress in Silicon Oxide Films using Cathodoluminescence Spectroscopy
11. In-Situ Raman Spectroscopic Surface Stress Measurement of Single Crystal Silicon Microstructures Subjected to Uniaxial Tensile Loading
12. Phase-modification for improving efficiency of audio coders.
13. Improved error resilience in mobile audio-visual communications.
14. High-speed interface testing [LSI]
15. Loudspeaker linearization using perceptual distortion measures
16. Phase-modification for improving efficiency of audio coders
17. Improved error resilience in mobile audio-visual communications
18. Super-frame based source controlled variable rate coding using approximated trellis diagram
19. Thermal distribution of Cu2O paraexcitons in a strain-induced trap probed by excitonic Lyman spectroscopy.
20. Enhanced formation of electron-hole droplets in diamond by a weak pulse injection.
21. Super-frame based source controlled variable rate coding using approximated trellis diagram.
22. Loudspeaker linearization using perceptual distortion measures.
23. High-speed interface testing [LSI].
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