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4. Impact of Process Variations on the Capacitance and Electrical Resistance down to $1.44\ \mu\mathrm{m}$ Hybrid Bonding Interconnects

5. 28nm FDSOI CMOS Technology (FEOL and BEOL) Thermal Stability for 3D Sequential Integration: Yield and Reliability Analysis

7. Hybrid bonding for 3D stacked image sensors: impact of pitch shrinkage on interconnect robustness

9. Fine pitch 3D interconnections with hybrid bonding technology: From process robustness to reliability

12. Making Synchrotron Tomography a Routine Tool for 3D Integration Failure Analysis through a Limited Number of Projections, an Adapted Sample Preparation Scheme, and a Fully-Automated Post-Processing

15. ITAC: A complete 3D integration test platform

16. Reliable 300 mm Wafer Level Hybrid Bonding for 3D Stacked CMOS Image Sensors

49. 300 mm Multi Level Air Gap Integration for Edge Interconnect Technologies and Specific High Performance Applications

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