16 results on '"Meyer, M.A."'
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2. Integration Aspects of CoWP Capping Layers for Electromigration Enhancement
3. Comprehensive reliability analysis of CoWP Metal Cap unit processes for high volume production in sub-μm dimensions
4. Electromigration-induced copper interconnect degradation and failure: the role of microstructure.
5. PREDICT: a case study, using fuzzy logic.
6. Failures in copper interconnects-localization, analysis and degradation mechanisms.
7. Characterizing reliability in a product/process design-assurance program.
8. Log-Periodic Octaline Hybrid Junctions.
9. An acoustoelectric transistor
10. SOS liquid crystal TV display
11. Failures in copper interconnects-localization, analysis and degradation mechanisms
12. Characterizing reliability in a product/process design-assurance program
13. Uncertainty quantification: methods and examples from probability and fuzzy theories
14. Log-Periodic Octaline Hybrid Junctions
15. PREDICT: a case study, using fuzzy logic
16. Electromigration-induced copper interconnect degradation and failure: the role of microstructure
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