19 results on '"Lepilliet, Sylvie"'
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2. A 140 GHz to 170 GHz Active Tunable Noise Source Development in SiGe BiCMOS 55 nm Technology
3. Power Measurement Setup Development for On-Wafer Characterization at 185–191 GHz
4. 22nm Ultra-Thin Body and Buried Oxide FDSOI RF Noise Performance
5. RF characterization and small signal extraction on 22 nm CMOS fully-depleted SOI technology
6. Investigating the potential of SiGe Diode in BiCMOS 55nm for power detection and datacom applications at 300 GHz
7. On Wafer Millimetre Wave Power Detection Using a PN Junction Diode in BiCMOS 55 nm for In-Situ Large Signal Characterization
8. A 140 GHz to 160 GHz active impedance tuner for in-situ noise characterization in BiCMOS 55 nm
9. A 130 to 170 GHz integrated noise source based on avalanche silicon Schottky diode in BiCMOS 55 nm for in-situ noise characterization
10. A D-band passive receiver with 10 dB noise figure for in-situ noise characterization in BiCMOS 55 nm
11. A 135–150 GHz frequency quadrupler with 0.5 dBm peak output power in 55 nm SiGe BiCMOS technology
12. High frequency noise characterisation of graphene FET device
13. J-band on wafer measurements of Planar Goubau Sommerfeld Lines and coplanar waveguides
14. 80 GHz low noise amplifiers in 65nm CMOS SOI
15. Noise and Dynamic Cryogenic performance of Metamorphic Transistors from 20 to 42 GHz
16. Benefits and validation of 4-dummies de-embedding method for characterization of SiGe HBT in G-band.
17. Impact of down scaling on high-frequency noise performance of bulk and SOI MOSFETs
18. 94-GHz MMIC CPW low-noise amplifier on InP
19. 94-GHz MMIC CPW low-noise amplifier on InP.
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