24 results on '"LaBel, K."'
Search Results
2. TID Test Results for 4th Generation iPad™
3. Enhancing observability of signal composition response and error signatures during dynamic SEE analog to digital device testing
4. TID and SEE Response of Advanced Samsung and Micron 4G NAND Flash Memories for the NASA MMS Mission
5. Radiation Performance of 1 Gbit DDR2 SDRAMs Fabricated with 80-90 nm CMOS
6. TID and SEE Response of Advanced 4G NAND Flash Memories
7. Effectiveness of internal vs. external SEU scrubbing mitigation strategies in a Xilinx FPGA: Design, test, and analysis
8. TID and SEE Response of an Advanced Samsung 4Gb NAND Flash Memory
9. Radiation Performance of 1 Gbit DDR SDRAMs Fabricated in the 90 nm CMOS Technology Node
10. NASA Electronic Parts and Packaging (NEPP) Program: assurance research on optoelectronics
11. Characterization of transient error cross sections in high speed commercial fiber optic data links.
12. In situ measurement of the particle linear energy transfer using the sensitive junctions of the device under test.
13. Radiation effects considerations for the application of photonics in space systems
14. Single event effect proton and heavy ion test results in support of candidate NASA programs.
15. SEU tests of a 80386 based flight-computer/data-handling system and of discrete PROM and EEPROM devices, and SEL tests of discrete 80386, 80387, PROM, EEPROM and ASICs.
16. Single event effect testing of the Intel 80386 family and the 80486 microprocessor.
17. In situ measurement of the particle linear energy transfer using the sensitive junctions of the device under test
18. Single event effect proton and heavy ion test results in support of candidate NASA programs
19. Single event effect testing of the Intel 80386 family and the 80486 microprocessor
20. Characterization of transient error cross sections in high speed commercial fiber optic data links
21. Radiation Performance of Commercial SiGe HBT BiCMOS High Speed Operational Amplifiers.
22. The Effects of ELDRS at Ultra-Low Dose Rates.
23. Particle-induced bit errors in high performance fiber optic data links for satellite data management
24. Charged particle effects on optoelectronic devices and bit error rate measurements on 400 Mbps fiber based data links
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.