15 results on '"Kisielowski C"'
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2. Aberration-corrected Electron Microscopy Imaging for Nanoelectronics Applications
3. Synthesis and Microstructures of α-Fe2O3 Bicrystalline Nanowires.
4. High-Resolution Interface Atomic Structure Analysis in Silicon Nitride Ceramics.
5. Effects of the Amorphous Oxide Intergranular Layer Structure and Bonding on the Fracture Toughness of a High Purity Silicon Nitride.
6. Quantification of Displacement Fields from Lattice Images (HREM) and Electron Exit Waves in Nanostructured Composite Oxides.
7. Real Time Observation and Characterization of Dislocation Motion, Nitrogen Desorption and Nanopipe Formation in GaN.
8. Determination of Coherency Strain Fields Around Coherent Particles in Ni-Al Alloys by HREM and CBED.
9. Deformation-Induced Dislocations in 4H-SiC and GaN.
10. Strain effects in GaN thin film growth.
11. X-Ray Photoemission Spectromicroscopy of Gan and AIGan.
12. Effect of Mg, Zn, Si, and O on the Lattice Constant of Gallium Nitride Thin Films.
13. Stress Gradients In Heteroepitaxial Gallium Nitride Films.
14. Stress Controlled MBE-growth of GaN:Mg and GaN:Si.
15. MBE-Growth of Strain Engineered GaN Thin Films Utilizing a Surfactant.
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