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8. Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering

11. Innovative Practice on Wafer Test Innovations

12. Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis

13. Company is in Debt to the Family: Work Contact During Family Time and Unethical Pro-Family Behavior.

14. Too Alienated to Have Good Family Lives? The Impact of Work Alienation on Family Functioning.

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