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Your search keyword '"HIGH resolution electron microscopy"' showing total 2 results
Start Over Descriptor "HIGH resolution electron microscopy" Topic nanotubes Topic transmission electron microscopy Publication Type Conference Materials Publisher american institute of physics
2 results on '"HIGH resolution electron microscopy"'

1. Formation mechanism of silicon carbide nanotubes with special morphology.

Author

Pei, L. Z., Tang, Y. H., Zhao, X. Q., Chen, Y. W., and Guo, C.

Subjects
*SILICON carbide, *NANOTUBES, *MICROSTRUCTURE, *TRANSMISSION electron microscopy, *HIGH resolution electron microscopy, DESIGN & construction
Abstract

SiC nanotubes have been synthesized under hydrothermal conditions. Research results show that SiC nanotubes consist of hollow inner pore, crystalline SiC wall layers, and thin amorphous silica sheath. Besides most abundant normal nanotubes, bamboo-shaped SiC nanotubes and elliptically hollow SiC nanospheres were also observed. The different morphologies of the SiC nanotubes are closely relative to the diameter of the SiC nanotubes. The confinement effect of other SiC nanotubes may play an important effect retarding the growth of SiC nanotubes to form the hollow SiC nanospheres. Defect inducing growth is proposed to explain the formation of bamboo-shaped SiC nanotubes. [ABSTRACT FROM AUTHOR]

Published
2006
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2. Novel freestanding nanotube devices for combining TEM and electron diffraction with Raman and Transport.

Author

Meyer, Jannik C., Paillet, Matthieu, Sauvajol, Jean-Louis, Obergfell, Dirk, Neumann, Anita, Duesberg, Georg, and Roth, Siegmar

Subjects
*NANOTUBES, *ELECTRON diffraction, *RAMAN effect, *HIGH resolution electron microscopy, *TRANSMISSION electron microscopy, *ELECTRON beam lithography
Abstract

A versatile procedure for combining high-resolution transmission electron microscopy (TEM) and electron diffraction with Raman spectroscopy and transport measurements on the very same nanotube is presented. For this we prepare free-standing structures on the corner of a substrate by electron beam lithography and an etching process. Further, this procedure makes possible a TEM quality control of nanotubes grown directly on the substrate. © 2005 American Institute of Physics [ABSTRACT FROM AUTHOR]

Published
2005
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