1. Free‐Standing Few‐Layer Tellurene Nanosheets: Simple Solution‐Phase Synthesis and Electronic Structure.
- Author
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Bhui, Animesh, Roychowdhury, Subhajit, Sen, Arpita, Waghmare, Umesh V., and Biswas, Kanishka
- Subjects
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BAND gaps , *ATOMIC force microscopy , *TRANSMISSION electron microscopy , *HIGH resolution electron microscopy , *NANOSTRUCTURED materials - Abstract
Mechanical stirring of bulk Te in N‐methyl‐2‐pyrrolidone (NMP) solution at room temperature resulted in the formation of free‐standing few‐layer (∼1.2–2.8 nm) crystalline ultrathin nanosheets of tellurene with a large lateral thickness (∼1–1.6 μm) as confirmed by atomic force microscopy (AFM). High‐resolution transmission electron microscopy (HRTEM) confirms the presence of α‐ and β‐phases of tellurene. First‐principle density functional theoretical (DFT) based electronic structure calculations demonstrate the indirect band gap of bi‐layer β‐tellurene. The band gap decreases with increasing number of layers in the tellurene nanosheet. [ABSTRACT FROM AUTHOR]
- Published
- 2022
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