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Start Over Descriptor "TEST systems" Publication Type Conference Materials Publication Type Trade Publications Region china

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1 results on '"TEST systems"'

1. Cost-Effective System Offers Flexible WLR Testing.

Subjects
*TEST systems, *SEMICONDUCTOR wafers
Abstract

Focuses on the system for wafer level reliability testing developed by the Research Institute of Micro/Nanometer Science and Technology of Shanghai Jiao-Toing University in Shanghai, China. Details of the test system; Key features.

Published
2003

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