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Nanoscale characterization of a number of different properties of surfaces and interfaces includes topography, electrostatic and magnetic fields, material properties, tribological properties, piezoresponse, and surface potential. All these properties can be studied in flexible environments with minimal sample preparation and in ambient and liquid environments using scanning probe microscopy. This chapter will focus on two primary techniques: scanning tunneling microscopy and atomic force microscopy. These modalities allow a surface scientist to characterize and study surfaces, interfaces, and surface reactions. [ABSTRACT FROM AUTHOR]